SCANNING PROBE MICROSCOPY
\skˈanɪŋ pɹˈə͡ʊb mˈa͡ɪkɹəskəpɪ], \skˈanɪŋ pɹˈəʊb mˈaɪkɹəskəpɪ], \s_k_ˈa_n_ɪ_ŋ p_ɹ_ˈəʊ_b m_ˈaɪ_k_ɹ_ə_s_k_ə_p_ɪ]\
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Electron microscopy in which a very sharp probe is employed in close proximity to a surface, exploiting a particular surface-related property. When this property is local topography, the method is atomic force microscopy (MICROSCOPY, ATOMIC FORCE), and when it is local conductivity, the method is scanning tunneling microscopy (MICROSCOPY, SCANNING TUNNELING).
By DataStellar Co., Ltd
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